Publikácie

Publikácie 2025

SOPKOVIČ, Kristián - KUPCOVÁ, Eva - HLÁDEK, Daniel - PLEVA, Matúš - HARAHUS, Maroš: Enhancing Slovak Natural Language Processing: Fine-Tuning Sentence BERT Models with Translated MS MARCO V2 Data Using MADLAD-400 / - 2025. In: IEEE 12th International Joint Conference on Cybernetics and Computational Cybernetics Cyber Medical Systems Proceedings. - Danvers (USA) : Institute of Electrical and Electronics Engineers s. 117-122 . - ISBN 9798331502454 Spôsob prístupu: https://doi.org/10.1109/iccc64928.2025.10999144.

YADAGIRI, Annepaka - KRISHNA, Reddi Mohana - PAKRAY, Partha - PLEVA, Matúš - HLÁDEK, Daniel - SOPKOVIČ, Kristián: Automatic Detection of AI-Generated Text from LLMs Using Feature-Driven Transformer Networks / - 2025. In: Artificial Intelligence in HCI : 6th International Conference AI-HCI 2025 : Held as Part of the 27th HCI International Conference HCII 2025 : Proceedings , Part 3. - Cham (Švajčiarsko) : Springer Nature s. 214-225 . - ISBN 978-3-031-93417-9 - ISSN 0302-9743 Spôsob prístupu: https://doi.org/10.1007/978-3-031-93418-6_15.

ALDRIDGE, Audrey - HUDSON, Christopher R. - SMINK, Karl - BUCK, Andrew R. - ANDERSON, Derek T. - PAUL, Victor - ANDERSON, Rachel - HOELSCHER, Drew - QUINN, Quinn, Mary - PLEVA, Matúš - BETHEL, Cindy L. - CARRUTH, Daniel W.: A Virtual Testbed for the Multidisciplinary Evaluation of Human-Agent Teaming Dynamics / - 2025. In: Human Interface and the Management of Information. - Cham (Švajčiarsko) : Springer Nature s. 165-183 [print, online]. - ISBN 978-3-031-93818-4 Spôsob prístupu: https://doi.org/10.1007/978-3-031-93819-1_13.

PAJKOŠ, Jaroslav - KUPCOVÁ, Eva - PLEVA, Matúš - DRUTAROVSKÝ, Miloš: ESP32 Microcontroller based Lightweight TLS 1.3 Client for IoT Applications / - 2025. In: 2025 35th International Conference Radioelektronika. - Piscataway (USA) : Institute of Electrical and Electronics Engineers s. [1-6] [online]. - ISBN 979-8-3315-4448-5 - ISSN 2767-9969 Spôsob prístupu: https://doi.org/10.1109/radioelektronika65656.2025.11008381.

SOPKOVIČ, Kristián - KUPCOVÁ, Eva - HLÁDEK, Daniel - PLEVA, Matúš: Efficient Acronymization of Sensitive Data Using Generative Models Fine-Tuned on LLM-Augmented Data / - 2025. In: 2025 35th International Conference Radioelektronika. - Piscataway (USA) : Institute of Electrical and Electronics Engineers s. [1-6] [online]. - ISBN 979-8-3315-4448-5 - ISSN 2767-9969 Spôsob prístupu: https://doi.org/10.1109/radioelektronika65656.2025.11008388.

SOKOLOVÁ, Zuzana - HARAHUS, Maroš - SOKOL, Miroslav - KUPCOVÁ, Eva - PLEVA, Matúš: Sentiment Analysis Using Transformer Models: BERT, T5, and GPT / - 2025. In: 2025 35th International Conference Radioelektronika. - Piscataway (USA) : Institute of Electrical and Electronics Engineers s. [1-6] [online]. - ISBN 979-8-3315-4448-5 - ISSN 2767-9969 Spôsob prístupu: https://doi.org/10.1109/radioelektronika65656.2025.11008427.

HARAHUS, Maroš - SOKOLOVÁ, Zuzana - PLEVA, Matúš - SOKOL, Miroslav: Grammatical Error Correction in Slovak Using Neural Machine Translation and No Language Left Behind / - 2025. In: 2025 35th International Conference Radioelektronika. - Piscataway (USA) : Institute of Electrical and Electronics Engineers s. [1-6] [online]. - ISBN 979-8-3315-4448-5 - ISSN 2767-9969 Spôsob prístupu: https://doi.org/10.1109/radioelektronika65656.2025.11008374.

HALUŠKA, Renát - PLEVA, Matúš - JAKUBČO, Valér: Biometrický Prístupový Systém Riadený a Manažovaný cez Počítačovú Sieť / - 2025. In: Electrical Engineering and Informatics 16 : Proceedings of the Faculty of Electrical Engineering and Informatics of the Technical University of Košice. - Košice (Slovensko) : Technická univerzita v Košiciach s. 465-470 [online]. - ISBN 978-80-553-4854-4 Spôsob prístupu: https://eei.fei.tuke.sk/wp-content/uploads/2025/07/EEI_16.pdf. [Archívne číslo: 315028]

HALUŠKA, Renát - PLEVA, Matúš - PAVLUS, Maroš: Overenie používateľa na základe dynamiky stlačení klávesov / - 2025. In: Electrical Engineering and Informatics 16 : Proceedings of the Faculty of Electrical Engineering and Informatics of the Technical University of Košice. - Košice (Slovensko) : Technická univerzita v Košiciach s. 471-475 [online]. - ISBN 978-80-553-4854-4 Spôsob prístupu: https://eei.fei.tuke.sk/wp-content/uploads/2025/07/EEI_16.pdf. [Archívne číslo: 315029]

SOPKOVIČ, Kristián - KUPCOVÁ, Eva - PLEVA, Matúš: Optimálne vytváranie vektorových reprezentácií vzhl’adom na sémantiku slovenského jazyka / - 2025. In: Electrical Engineering and Informatics 16 : Proceedings of the Faculty of Electrical Engineering and Informatics of the Technical University of Košice. - Košice (Slovensko) : Technická univerzita v Košiciach s. 525-530 [online]. - ISBN 978-80-553-4854-4 Spôsob prístupu: https://eei.fei.tuke.sk/wp-content/uploads/2025/07/EEI_16.pdf.

LUKÁČ, Martin - PLEVA, Matúš - KUPCOVÁ, Eva - SOPKOVIČ, Kristián: Automatické rozpoznávanie emócií z rečového signálu implementované vo webovej aplikácii / - 2025. In: Electrical Engineering and Informatics 16 : Proceedings of the Faculty of Electrical Engineering and Informatics of the Technical University of Košice. - Košice (Slovensko) : Technická univerzita v Košiciach s. 379 [online]. - ISBN 978-80-553-4854-4 Spôsob prístupu: https://eei.fei.tuke.sk/wp-content/uploads/2025/07/EEI_16.pdf.

KUPCOVÁ, Eva - PLEVA, Matúš - SOPKOVIČ, Kristián - LAPANIK, Tsimafei: Biometrická autentifikácia ako moderný prístup v internete vecí / - 2025. In: Electrical Engineering and Informatics 16 : Proceedings of the Faculty of Electrical Engineering and Informatics of the Technical University of Košice. - Košice (Slovensko) : Technická univerzita v Košiciach s. 385-391 [online]. - ISBN 978-80-553-4854-4 Spôsob prístupu: https://eei.fei.tuke.sk/wp-content/uploads/2025/07/EEI_16.pdf.

HARAHUS, Maroš - PLEVA, Matúš - RUSNÁKOVÁ, Renáta: Training T5 models for grammatical error detection in Slovak: Impact of dataset size / - 2025. In: 2025 IEEE 23rd World Symposium on Applied Machine Intelligence and Informatics : Proceedings. - Piscataway (USA) : Institute of Electrical and Electronics Engineers s. 389-394 [online]. - ISBN 979-8-3503-7936-5 - ISSN 2836-0834 Spôsob prístupu: https://doi.org/10.1109/sami63904.2025.10883152. [Archívne číslo: 315155]

LEE, Chia-Yun - PLEVA, Matúš - HLÁDEK, Daniel - LEE, Chin-We - SU, Ming-Hsiang: Ensemble learning for wafer defect pattern classification in the semiconductor industry / - 2025. In: IEEE Access : practical innovations, open solutions. - Piscataway (USA) : Institute of Electrical and Electronics Engineers, 2013 Roč. 13 (2025), s. 155714-155728 [online]. - ISSN 2169-3536 (online) Spôsob prístupu: https://doi.org/10.1109/access.2025.3604405.

Publikácie 2024